OAB Authors only
The list is ordered by I.F. in decreasing direction.
Documents in archives:
5
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Instrumental projects and technologies
- Author: Sironi, G
1/1 pag.
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Totals
- ∑Authors OAB/Tot.: 27 / 46
- Percentage OAB_Authors: 58.7%
- ∑citations: 7
- ∑I.F.: 4.31
- ∑ I.F. / n. publications: 0.86
5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS
Pareschi, Giovanni , Tagliaferri, Gianpiero , Attinà, Primo, Basso, Stefano , Borghi, Giuseppe, Citterio, Oberto , Civitani, Marta , Cotroneo, Vincenzo , Negri, Barbara, Sironi, Giorgia , Spiga, Daniele , et al.
2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 743704, 12 pp. (2009).
Citations: 7
I.F.: 4.31
Citations/Authors: 0.54
Vernani, D., Borghi, G., Citterio, O. , Moretti, S., Ritucci, A., Sironi, G. , Riva, M. , Basso, S. , Pareschi, G. , Tagliaferri, G. , Negri, B., et al.
2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by Vernani, D.; Borghi, G.; Citterio, O.; Moretti, S.; Ritucci, A.; Sironi, G.; Riva, M.; Basso, S.; Pareschi, G.; Tagliaferri, G.; Negri, B. Proceedings of the SPIE, Volume 7437, pp. 74370X-74370X-8 (2009).
Sironi, G. , Spiga, D. , Pareschi, G. , Missaglia, N., Paganini, L.
2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 743718, 12 pp. (2009).
7. TECHNICAL REPORTS
Calibration of W/Si multilayer samples for SIMBOL-X X-ray
telescope Phase A development
Spiga, D. , Proserpio, L. , Civitani, M. , Dell’Orto, E., Sironi, G. , Cotroneo, V. , Mattarello, V., Garoli, D., Boscolo Marchi, E.
2009, INAF/OAB internal report 02/2009
Engineering Models for SIMBOL-X Phase A: metrological and
X-ray analyses post PANTER tests
Spiga, D. , Sironi, G. , Salmaso, B. , Romaine, S., Bruni, R., Cotroneo, V. , Mattarello, V., Garoli, D.
2009, INAF/OAB internal report 07/2009